By Peter Willich (auth.), Dr. Abraham Boekestein, Prof. Miodrag K. Pavićević (eds.)
This complement of Mikrochimica Acta includes chosen papers from the second one Workshop of the eu Microbeam research Society (EMAS) "Modern advancements and functions in Microbeam Analysis", on which came about in could 1991 in Dubrovnik (Yugoslavia). EMAS was once based in 1987 by means of participants from just about all eu nations, which will stimulate study, functions and improvement of all different types of microbeam equipment. essentially the most very important actions EMAS is the business enterprise of biannual workshops for demonstrating the present prestige and constructing tendencies of microbeam tools. For this assembly, EMAS selected to spotlight the subsequent themes: electron-beam microanalysis (EPMA) of skinny motion pictures and quantitative research of ultra-light components, Auger electron spectroscopy (AES), electron strength loss spec trometry (EELS), high-resolution transmission electron microscopy (HRTEM), quantitative research of organic samples and standard-less electron-beam microanalysis. Seven introductory lectures and virtually seventy poster shows got by way of audio system from twelve ecu and non-European (U.S.A. and Argentina) international locations have been made. One can't think that each one fields of analysis in Europe have been duly represented, yet a distinct development is discernible. EPMA with wavelength-dispersive spectrometry (WDS) or energy-dispersive spectrometry (EDS) is the strategy with via some distance the widest diversity of functions, through TEM with EELS after which AES. There also are fascinating feedback for the extra improvement of recent appa ratus with new fields of software. functions are seriously biased in the direction of fabrics technology (thin movies in microelectronics and semicon ductors), ceramics and metallurgy, via research of organic and mineral samples.
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This complement of Mikrochimica Acta includes chosen papers from the second one Workshop of the ecu Microbeam research Society (EMAS) "Modern advancements and functions in Microbeam Analysis", on which happened in may perhaps 1991 in Dubrovnik (Yugoslavia). EMAS was once based in 1987 by way of contributors from just about all ecu international locations, for you to stimulate learn, functions and improvement of all varieties of microbeam equipment.
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Extra info for Electron Microbeam Analysis
G. the carbides ZrC, NbC and M0 2C. The use of one particular set of mac's may lead to satisfactory results only for NbC and while much too low k-ratios can be calculated for ZrC the calculations for M0 2C may come out much too high. If systematic differences in X-ray emission can be ignored these peculiar observations must be regarded as a serious indication that the mac for C-KIX X-rays is much too high in Zr and much too low in Mo. Since we are dealing here with compounds of neighbouring elements the discrepancies can never be explained by improper functioning of the correction program used because the equations upon which all programs are based are invariably smooth functions of atomic number Z and atomic weight A, either in an explicit or implicit way.
In routine EPMA it is common practice to perform a peak search on standard and specimen and to compare the net peak intensities in order to obtain their ratio: the well-known k-ratio. From a fundamental point of view one could argue that it would be more appropriate to compare the integrals of the emitted intensities over the relevant wavelength range, in other words: the total emitted intensities associated with the specific electronic transition under consideration. If this is the correct thing to do then peak intensity measurements can only lead to correct k-ratios if it can be assumed that the peak G.
Cazaux LASSI/GRSM, BP 347, Faculte des Sciences, F-51062 Reims Cedex, France Abstract. The parameters, characterizing the performance (elemental information, sensitivity, lateral resolution, minimum detectable mass), and the trends of Auger microscopy,. are analyzed in detail by referring, at each step, to the corresponding parameters of electron probe microanalysis (EPMA). Special attention is paid to the surface sensitivity of the two techniques, to the EPMA analysis ofa thin coating and to the quantification problems associated with the determination of the Auger backscattering factor or the <1>(0) function in EPMA.
Electron Microbeam Analysis by Peter Willich (auth.), Dr. Abraham Boekestein, Prof. Miodrag K. Pavićević (eds.)